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活動_穎崴_CPO論壇簡報_20260514

更新 2026-05-15

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Your Trusted Partner in Semiconductor Testing

The Evolution of Co-Packaged Optics (CPO) Advanced Testing Methodologies for Silicon Photonics Ai

Published Date 2026/05/14

Version v1.0

Presenter: Collins Sun

01

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CPO and Test Flow

Bottleneck of Testing in CPO Production

CPO Roadmap & Trend

CPO/CPC Application

WinWay CPO/CPC Total Solution

Winkay

Tech

CPO and Test Flow

Winkay

Tech

Optical Industry M&A Wave in the AI Era

Nov 2024

Celestial AI acquires Rockley Photonics IP

Feb 2025

Nokia acquires Infinera

May 2025

AMD acquires Enosemi

Optical networking & DCI $2.3B

Dec 2025

Marvell to acquire Celestial AI

Apr 2026

Credo to acquire DustPhotonics

Apr 2026

Marvell acquires Polariton Technologies

$5.5M

Optical scale-up for AI

SiPho PIC vertical integration $1.3B

Undisclosed

Plasmonics + SiPho modulation

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Chipmakers & Hyperscalers Back Photonics

Oct 2024

Google Ventures et al.

  • → Lightmatter

Oct 2024

Cisco • NVIDIA

  • → Xscape Photonics

Dec 2024

AMD • Intel • NVIDIA

  • → AyarLabs

IC Design (joint) → Optical I/O

CSP → Photonic Computing

CSP/Networking + IC → DWDM

Feb 2026

MediaTek

  • → AyarLabs

Mar 2026

NVIDIA

  • → Lumentum

Mar 2026

NVIDIA

  • → Coherent

$90M

IC Design → Optical I/O

IC Design → Laser / SiPho

$2.0B

$2.0B

IC Design → Laser / Networking

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No Single Company Can Solve These Problems

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The Cost of Distance

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Light and electricity are not competing technologies. They are two manifestations of the exact same physical essence.

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Light and Electricity : Two Quadrants of the Same Electromagnetic Field WinWay 77 It 74 $

Electrical

  • Electron
  • Conductor with return path
  • Copper + Dielectric (Dk/Df)
  • Skin effect~1dB/cm@53GHz
  • mm~cm(in-package)
  • Severe EMI, Coupling

Loss

~1 dB/cm v.s <0.2 dB/km

Frequency

DC~100 GHz v.s ~193 THz

Distance

mm~cm (SR) v.s cm~km (LR)

EMI

EMI Sensitive v.s EMI immune

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Optical

  • Photon
  • Internal reflection in wave guide
  • Si+SiO2
  • Rayleigh scatter <0.2dB/km@1550nm
  • cm~km Cross datacenter
  • EMI Immune

CPO (Co-Packaged Optics)

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Optical Engine

Optical Circuit

~2016

Co-Packaged Optics Trend

Pluggable Optics

100% Cu

2023

OBO (On-Board Optics)

80% Cu + 20% Optics

2025

NPO (Near-Packaged Optics)

50% Cu + 50% Optics

2027

2.5D CPO (COUPE Switch)

20% Cu + 80% Optics

2030~

3D CPO (COUPE XPU)

100% Optics

Bandwidth ~800G <1.6T <3.2T <6.4T 12.8T~
Power Use 1x ~0.8x ~0.6x <0.5x <0.1x
Latency 1x <0.75x <0.5x <0.1x <0.05x
Maintenance

Electrical Circuit

Connector

Source : Counterpoint Research 《矽光子與共同封裝光學( CPO )報告》

Silicon Photonics Supply Chain

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Source : SEMI VISION

The Photonic Integrated Circuit (PIC) Blueprint

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Source : Official Website

Step1 : The Light Source Matrix

DFB Laser

(Distributed Feedback)

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Highly Stable wavelength, narrow linewidth. Ideal for standard 1310nm/1550nm telecom.

VCSEL

(Vertical-Cavity Surface-Emitting Laser)

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Low cost, easy to form arrays. Ideal for shortreach data centers.

Limitation : Less suited for long-reach / highpower

Comb Laser

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Crucial for 102.4T CPO.

Generates multiple precise wavelengths from one device, enabling massive WDM density

Step2 : The Modulator Showdown

MZM ( Mach-Zehnder )

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EAM ( Electro-Absorption )

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MRM ( Micro-Ring )

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Footprint Large (1-3 mm) Micro (10-20 um) Small (50-100 um)
High Medium Medium Bandwidth
High Critical(Requires TEC) Medium Thermal Stability
Excellent Moderate Poor PAM4 Linearity
Highest(10+ Yrs) Medium Medium Yield / Maturity
Broadcom / Intel / Marvell / Lightmatter / Cisco nVIDIA / AyarLabs Coherent / Lumentum / Intel Customer

Source : Official Website

Step3 : Routing The Light

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Step4 : Wavelength Division Multiplexing (WDM)

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Target KPI

  • Crosstalk must be maintained at -20 dB.

Step5 : I/O Coupling Strategy

Grating Couplers

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Light enters/exits vertically. High insertion loss, wavelength sensitive.

Advantage

Enables wafer-level testing (testing from the top before dicing).

Edge Couplers

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High bandwidth, ultra-low insertion loss (<1.0 dB). Polarization insensitive. Ideal for 128-core FAU.

Challenge

Demands extreme sub-micron alignment precision.

Different Optical Engine Design

Source : IDTechEx Research

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Marvell

From OE to Module / Spec Diversity

RAAHHARA

nVIDIA

nVIDIA

Lightmatter

Lightmatter

Broadcom

AyarLabs

Broadcom

Source : Official Website

Key Foundries of Silicon Photonics and CPO

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Source : DIGITIMES, 2026/04

Bottleneck of Testing in CPO Production

Winkay

Tech

CPO Test Flow / Production Bottle Neck

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Passive Cable Attachment

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Electro-Optical Testing of Engines

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Source: Teradyne

Why Must CPO Use Single Mode Fiber (SMF)?

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Result: collapses beyond 100 m or above 100 Gbps

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Result: enables 200 Gbps+ over 2 km+, ideal for CPO deployment

The silicon photonics waveguide itself is single-mode -light leaving the ASIC is fundamental-mode from the start. Using SMF is not a design choice for CPO; it is a physical consequence dictated at the wafer level by the silicon photonics platform.

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FAU Active Alignment Challenge

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Tolerance Stack-up: 3.8 μ m| 42% of core diameter.

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Active Alignment

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CPO Production Assessment

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Module Test Challenge

Pick & Place, Plug & Play

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CPO Production Bottleneck Four Technical Issues

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Co-Packaged Optics Test Flow

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Package Level

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Wafer Level Test Methodology

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Die Level Test Methodology

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Package Level Test Methodology

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Test Requirement Active alignment , Passive alignment, Direct with FAU

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Electrical Signal Path (Load Board → EIC)

Optical Signal Path (EIC → PIC → Fiber)

Package Level Test Methodology

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Module Level Test Methodology

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Test Requirement Test speed, Alignment, Mechanism Design.

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CPO Roadmap

Winkay

Tech

COUPE : COmpact Universal Photonic Engine

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Source : TSMC

Bandwidth

CPO Roadmap

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The I/O Interface Evolution

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CPO/CPC Application

Winkay

Tech

CPO / CPC Application

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Source : Official Website

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WinWay CPO/CPC Total Solution

Winkay

Tech

Future Technical Challenge

A. Mechanical Extremes

B. Electrical Performance Barriers

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  • Package Size > 100 mm up to 200mm
  • Pin Count > 10,000 pins up to 50,000 pins
  • Key Challenge Warpage up to 0.6mm

Technical Development Direction to 'Optics'

The challenges of package testing have evolved from a focus on mechanical machining accuracy to multi-physics coupled design , encompassing mechanical integrity, electrical performance, thermal management.

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  • Signal Speed 224Gbps PAM4 and beyond
  • Key Challenge Signal Integrity, Crosstalk

C. Thermal Density Crisis

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  • Power Consumption > 4000W per device
  • Key Challenge Thermal Runaway / Solder Melt

Interposer Size

A. Mechanical Extremes / TSMC

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Package size dimension determine by # of Die, Memory, High Speed I/O Channel, Manufacturing limitation…

Source : IDTechEx Research

A. Mechanical Extremes /Intel

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Source : Intel

B. Electrical Performance Barriers

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Parameter 224G (PAM4) 448G(PAM4) 448G(PAM6) 448G(PAM8)
224Gbps 448Gbps 448Gbps 448Gbps Data rate
log 2 4 =2 log 2 4 =2 log 2 6 ~2.58 log 2 8 =3 Bits / Symbol
112 GBaud 224 GBaud ~173.6 GBaud ~150 GBaud Baud Rate
56GHz 112GHz 86.8 GHz 74.7GHz Nyquist Freq.
0 dB (Ref) 0 dB (Ref) -3.7 dB -6.2 dB SNR Penalty
Medium High Higher Highest DSP Complexity
Mature ecosystem : Feasible on standard PCB/Cable Simple architecture : Best theoretical SNR. Goldilocks Choice : Balances BW&SNR. Low Baud Rate for 448G target Pros
Requires 2X lanes to match 448G total rate. Bandwidth Wall : Unfeasible for copper SNR Penalty : Complex encoding logic SNR Cliff : Requires powerful FEC Cons
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The 448G Electrical Wall

Copper Channel Loss

Insertion loss approaches -10dB on just 1 inch of premium dielectric at 112 GHz Nyquist.

Dielectric Loss Multiplier

Loss scales linearly with frequency.

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The Skin Effect Limit

At > 100GHz, skin depth drops below 0.2 um

DSP Power Explosion

Compensating for physical loss requires ADC sampling > 224 GS/s.

1 reticle Max. ~830mm 2 Chip heat density design reference : 1.1~2 W/mm 2

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  • ◼ Advanced Thermal Control System
  • ◼ Higher CCC requirement (>6A/pin)

C. Thermal Density Crisis

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GPU Architecture 2026 AI Chip 2032 2029 2035
GPU Die Size 728mm 2 750mm 2 700mm 2 600mm 2
GPU Power 800W 900W 1,000W 1,200W
Interposer Size GPU HBM Interposer
X2 X4 X4 # of GPU Dies X8
HBM4 X8 HBM5 X8 HBM6 X16 # of HBM Stack HBM7 X32
75W 100W 120W HMB Power per Stack 180W
2,198mm 2 (46.2 mmx48.5 mm) 4,788mm 2 (85.2 mmx56.2 mm) 6,014mm 2 (102.8 mmx58.5 mm) Interposer Die Stack 9,245mm 2 (96.4 mmx95.9
16/32 TB/s 48 TB/s 128/256 TB/s Total Bandwidth 1,024 TB/s
Total HBM Capacity 288/384 GB 400/500 Source : KAIST 1,536/1,920 GB TERALAB GB 5,120/6,144
Total Power 2,200W 4,400W 5,920W 15,360W

Source : KAIST TERALAB

A+B+C : Heterogeneous Integration

CPO is the path to success in near future

The Problem with Organic Substrates

  • ◼ Thermal / Mechanical Instability
  • ◼ Electrical Loss

High CTE Mismatch Silicon:

Causes Warping & Misalignment

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Organic Substrate

Why Glass is the Breakthrough Solution

  • ◼ Superior Stability
  • ◼ Pristine Electrical Performance
  • ◼ Advanced Integration

Near-Perfect CTE Match to Silicon:

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Glass interposer / Substrate

Challenges of Advanced Package Test Solutions

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High Pin Count

>20KPin

  • ◼ Preload force
  • ◼ Maintenance
  • ◼ Random fail concern

Housing Warpage by Preload

Contact Resistance random fail (If 20 pin fail/20,000~0.1%)

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High Heat Density

>4000W

  • ◼ Socket thermal domain
  • ◼ Thermal run away

IC>4000W

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Socket Power Loss>500W

Socket housing thermal distribution

Innovation of Hybrid Architecture / Conventional Test Interface

Elastomer

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Spring probe

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Length(mm) 0.5~2.0 ★ 1.5~6 even longer depend on the requirement
★ <50 (Multiple contacts) <60 (Design dependent, including probe structure) Resistance (mohm)
0.2(Min.)~0.4(Max.) ★ 0.35(Min.)~1.0(Max.) Travel (mm)
20~50/per bump ★ 15~25/per pin Force(g)
~4 ★ Up to 6 CCC(A)
Not really applicable ★ Applicable Coaxial Structure
★ clean by sticker clean by brush/clean pad/laser Maintenance
Whole piece, but easy to replace ★ Individual probe replaeable, but take times to replace &maintenance Spare part
• Hard to balance lower force <20g, contact resistance and lifetime PS: Normally, reflected force varies from 30~50g/per bump • Shorter contact travel <0.4mm(Max) to cover package warpage • Shorter lifetime (can not replace individually) • No coaxial structure for large package application • Limited four contact points of top plunger design • Need regular clean to maintain Cres • Physical damage to solder ball and pad if wrong setup Limitation

Innovation of Hybrid Architecture HyperSocket TM

Contact Resistance

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Cres (mohm)

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Current Carrying Capacity

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Why HyperSocket is suitable for Advantaged Package Testing(Ultra Large Package)?

Limitation Characteristics
Elastomer Lifetime Significantly increase contact surface between contactor to solder ball and PCB pad
Higher Initial investment Less and stable contact resistance↓30%
Higher current carrying capacity(C.C.C.)↑30% Less joule heat generation by high current↓30% No housing warpage of spring probe socket Lower total test cost of ownership: Factory operation,
Hardware, Maintenance and Test interface including Change Over Kit, Socket, PCB.

Innovative Test Solution HyperSocket TM

Requirements for HyperSocket TM Design

  • ◼ Package Size

  • ◼ Pin count

  • ◼ Device Warpage

  • ◼ High Current Density

  • ◼ SACQ(Frequent Clean)

  • ◼ Solder Ball Melting

  • ◼ Probe bent and worn out issue

>100 X 100 mm 2

>10,000 pin

>0.4 mm

>6 A

~10 TD

Patent NO .

  • TWI862047
  • TWI922268
  • TWI862191
  • TWI901161
  • TWI884802
  • TWI923382

Hyper-UF

Frequent Clean, Solder Ball Melting

Hyper-DH

High Current Density, Probe Bent

Hyper-LF

Ultra Large Package, High Pin Count

Hyper-Liquid

Under Validation

Extremely High Power > 2500W

  • TWI901181
  • CN220584352
  • US(Granted )

Summary

Winkay

Tech

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2026 - 2028 is the golden window for ASIC platform flexibility.

One ASIC supporting both CPO and CPC -Scale-up via CPO for performance, Scale-out via pluggable for flexibility.

NVIDIA SIGNALS

  • 1.6T CPO saves 180MW at million-GPU scale
  • Spectrum-X: 5 × efficiency, 2Tb/s, 10 × reliability
  • CPO and copper coexist, layered deployment
  • Scale-up is the main battlefield
  • Adoption: coexist → expand → mainstream
  • ELS architecture, DSP-free design

CORE CHALLENGES

  • Thermal & yield: one defect kills package
  • Serviceability: operations SOP rebuilt
  • Standards & cost: ecosystem immature

WinWay is Ready for CPO & CPC Testing

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Q

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THANK YOU

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+886 7 361 0999 / +886 3 656 8282

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